Show simple item record

dc.contributor.authorGiannetti, Romanoes-ES
dc.date.accessioned2019-09-11T04:01:04Z
dc.date.available2019-09-11T04:01:04Z
dc.date.issued19/05/1997es_ES
dc.identifier.urihttp://hdl.handle.net/11531/40684
dc.descriptionCapítulos en libroses_ES
dc.description.abstractes-ES
dc.description.abstractA considerable number of measurements for material, device and system characterization rely on the analysis of its step response. Sometimes, there is no accepted model for the physical phenomenon, so that not only the values, but also the numbers of time constants are to be determined. A similar case can occur when we must try to choose between different models. This work presents an algorithm to determine the number of the exponential terms in the waveform that can be safely measured given the measurement system accuracy.en-GB
dc.format.mimetypeapplication/pdfes_ES
dc.language.isoen-GBes_ES
dc.publisherSin editorial (Ottawa, Canadá)es_ES
dc.rightses_ES
dc.rights.uries_ES
dc.sourceLibro: 14th IEEE Instrumentation and Measurement Technology Conference - IMTC 1997, Página inicial: 544-547, Página final:es_ES
dc.subject.otherInstituto de Investigación Tecnológica (IIT)es_ES
dc.titleMultiple time constants measurement: an accuracy-based approaches_ES
dc.typeinfo:eu-repo/semantics/bookPartes_ES
dc.description.versioninfo:eu-repo/semantics/publishedVersiones_ES
dc.rights.accessRightsinfo:eu-repo/semantics/restrictedAccesses_ES
dc.keywordses-ES
dc.keywordsTime measurement,Noise measurement, Fitting, Telecommunications, Composite materials, Materials testing, System testing, Transient response, Writing, Random sequencesen-GB


Files in this item

Thumbnail

This item appears in the following Collection(s)

  • Artículos
    Artículos de revista, capítulos de libro y contribuciones en congresos publicadas.

Show simple item record