• English
    • español
  • English 
    • English
    • español
  • Login
View Item 
  •   Home
  • 2.- Investigación
  • Artículos
  • View Item
  •   Home
  • 2.- Investigación
  • Artículos
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Metric tools for sensitivity analysis with applications to neural networks

Thumbnail
View/Open
IIT-25-171R_preview (3.425Kb)
Date
2025-08-01
Author
Pizarroso Gonzalo, Jaime
Alfaya Sánchez, David
Portela González, José
Muñoz San Roque, Antonio
Estado
info:eu-repo/semantics/publishedVersion
Metadata
Show full item record
Mostrar METS del ítem
Ver registro en CKH

Refworks Export

Abstract
 
 
As Machine Learning models are considered for autonomous decisions with significant social impact, the need to understand how these models work rises rapidly. Explainable Artificial Intelligence (XAI) aims to provide interpretations for predictions made by Machine Learning models, in order to make the model trustworthy and more transparent for the user. For example, selecting relevant input variables for the problem directly impacts the model’s ability to learn and make accurate predictions. One of the main XAI techniques to obtain input variable importance is the sensitivity analysis based on partial derivatives. However, existing literature of this method provides no justification of the aggregation metrics used to retrieved information from the partial derivatives. In this paper, a theoretical framework is proposed to study sensitivities of ML models using metric techniques. From this metric interpretation, a complete family of new quantitative metrics called α-curves is extracted. These α-curves provide information with greater depth on the importance of the input variables for a machine learning model than existing XAI methods in the literature. We demonstrate the effectiveness of the α-curves using synthetic and real datasets, comparing the results against other XAI methods for variable importance and validating the analysis results with the ground truth or literature information.
 
URI
https:doi.org10.1016j.asoc.2025.113300
Metric tools for sensitivity analysis with applications to neural networks
Tipo de Actividad
Artículos en revistas
ISSN
1568-4946
Materias/ categorías / ODS
Instituto de Investigación Tecnológica (IIT)
Palabras Clave

Sensitivity; Machine learning; Feature importance; Explainable A; Regressio; Feature engineering; Neural networks
Collections
  • Artículos

Repositorio de la Universidad Pontificia Comillas copyright © 2015  Desarrollado con DSpace Software
Contact Us | Send Feedback
 

 

Búsqueda semántica (CKH Explorer)


Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsxmlui.ArtifactBrowser.Navigation.browse_advisorxmlui.ArtifactBrowser.Navigation.browse_typeThis CollectionBy Issue DateAuthorsTitlesSubjectsxmlui.ArtifactBrowser.Navigation.browse_advisorxmlui.ArtifactBrowser.Navigation.browse_type

My Account

LoginRegister

Repositorio de la Universidad Pontificia Comillas copyright © 2015  Desarrollado con DSpace Software
Contact Us | Send Feedback