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Fecha de publicación | Título | Autor(es) |
24 | A novel characterization tool for the study of dielectric breakdown of ultra-thin oxide MOS structures | Basso, Giovanni; Crupi, Felice; Neri, Bruno; Giannetti, Romano; Lombardo, Salvo |
1 | Temperature controlled multi-oven for MTF tests | Ciofi, Carmine; Giannetti, Romano; Neri, Bruno |
1 | True constant temperature measurement system for lifetime tests of metallic interconnections of IC's | Ciofi, Carmine; Giannetti, Romano; Neri, Bruno |
19 | Ultra low noise current sources | Ciofi, Carmine; Giannetti, Romano; Dattilo, Vincenzino; Neri, Bruno |
1 | Ultra low noise, current to voltage converter with offset compensation independent of the source impedance | Ciofi, Carmine; Festa, G.; Giannetti, Romano; Neri, Bruno |
1 | Ultra low-noise current sources | Ciofi, Carmine; Giannetti, Romano; Dattilo, Vincenzino; Neri, Bruno |