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http://hdl.handle.net/11531/40680| Título : | Temperature controlled multi-oven for MTF tests |
| Autor : | Ciofi, Carmine Giannetti, Romano Neri, Bruno |
| Fecha de publicación : | 1 |
| Editorial : | Sin editorial (Saint Paul, Estados Unidos de América) |
| Resumen : | The design and principle of operation of a measurement system primarily intended for performing MTF (median time to failure) tests on metallic interconnections of integrated circuit is presented. The instrument is different from other similar equipment in that a separate heating system is used for each sample. This approach will allow one, probably for the first time, to perform such tests in the ideal conditions of constant current and temperature for all the samples. |
| Descripción : | Capítulos en libros |
| URI : | http://hdl.handle.net/11531/40680 |
| Aparece en las colecciones: | Artículos |
Ficheros en este ítem:
| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| IIT-98-088A.pdf | 483,95 kB | Adobe PDF | Visualizar/Abrir Request a copy |
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