Temperature controlled multi-oven for MTF tests
Fecha
01/06/1998Estado
info:eu-repo/semantics/publishedVersionMetadatos
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Temperature controlled multi-oven for MTF tests
Tipo de Actividad
Capítulos en librosMaterias/ categorías / ODS
Instituto de Investigación Tecnológica (IIT)Palabras Clave
Temperature control, Circuit testing, Performance evaluation, Time measurement, Integrated circuit measurements, Integrated circuit testing, System testing, Integrated circuit interconnections, Instruments, Heating