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dc.contributor.authorde Curtò i Díaz, Joaquimes-ES
dc.contributor.authorde Zarzà i Cubero, Irenees-ES
dc.contributor.authorRoig, Gemmaes-ES
dc.contributor.authorCalafate, Carlos T.es-ES
dc.date.accessioned2024-04-04T14:14:58Z-
dc.date.available2024-04-04T14:14:58Z-
dc.date.issued2023-05-11es_ES
dc.identifier.issn2079-9292es_ES
dc.identifier.urihttps://doi.org/10.3390/electronics12102192es_ES
dc.identifier.urihttp://hdl.handle.net/11531/87974-
dc.descriptionArtículos en revistases_ES
dc.description.abstract.es-ES
dc.description.abstractIn this paper, we address the research gap in efficiently assessing Generative Adversarial Network (GAN) convergence and goodness of fit by introducing the application of the Signature Transform to measure similarity between image distributions. Specifically, we propose the novel use of Root Mean Square Error (RMSE) and Mean Absolute Error (MAE) Signature, along with Log-Signature, as alternatives to existing methods such as Fréchet Inception Distance (FID) and Multi-Scale Structural Similarity Index Measure (MS-SSIM). Our approach offers advantages in terms of efficiency and effectiveness, providing a comprehensive understanding and extensive evaluations of GAN convergence and goodness of fit. Furthermore, we present innovative analytical measures based on statistics by means of Kruskal–Wallis to evaluate the goodness of fit of GAN sample distributions. Unlike existing GAN measures, which are based on deep neural networks and require extensive GPU computations, our approach significantly reduces computation time and is performed on the CPU while maintaining the same level of accuracy. Our results demonstrate the effectiveness of the proposed method in capturing the intrinsic structure of the generated samples, providing meaningful insights into GAN performance. Lastly, we evaluate our approach qualitatively using Principal Component Analysis (PCA) and adaptive t-Distributed Stochastic Neighbor Embedding (t-SNE) for data visualization, illustrating the plausibility of our method.en-GB
dc.format.mimetypeapplication/pdfes_ES
dc.language.isoes-ESes_ES
dc.rightsCreative Commons Reconocimiento-NoComercial-SinObraDerivada Españaes_ES
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/es_ES
dc.sourceRevista: Electronics, Periodo: 1, Volumen: 12, Número: 10, Página inicial: 2192, Página final: .es_ES
dc.titleSignature and Log-Signature for the Study of Empirical Distributions Generated with GANses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.description.versioninfo:eu-repo/semantics/publishedVersiones_ES
dc.rights.holderes_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.keywords.es-ES
dc.keywordsGAN; FID; generative models; Signature Transform; PCA; t-SNE; clusteringen-GB
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